RF View (S-Parameter & Match)

RF View is an all-in-one RF engineering tool for Android and Windows Desktop. Inspect Touchstone S-parameter data, simulate matching networks, run batch production analysis, and control your VNA — all in one app. [Key Features] 1. S-Parameter Viewer & Plots Visualize .s1p, .s2p, and .sNp files on Smith Charts, dB/Phase plots, and Group Delay charts. Use multiple markers for precise measurements and overlay LTE, 5G NR, and WiFi bands to check frequency responses instantly. Open files from email, cloud drives, or drag & drop (Desktop). 2. RF Circuit Simulator Build and simulate 2-port RF networks with lumped elements (L/C/R) and transmission lines. Auto-matching synthesizes impedance matching networks automatically. Monte Carlo analysis predicts component tolerance effects. Verify designs using real Murata inductor/capacitor S-parameters. Send results to the plot view to compare against measured data. 3. SNP Converter & Batch Processing Convert SNP files to CSV, split S2P files, map ports, and sort datasets in batch. Generate Tx/Rx channel loss summary tables and export as CSV for reporting. 4. Essential RF Utilities Band/Frequency Calculator (LTE, 5G NR, GSM, WiFi), Filter Design, Microstrip Calculator (Z0, εeff, loss), Attenuator design (T/Pi), S11↔Z conversion, and Q-factor estimation. 5. Windows Desktop — Exclusive Features VNA Direct Control (Free): Connect Keysight ENA or PNA via GPIB or USB (NI-VISA). Capture screen images (PNG) and save S-parameter files (.s1p–.s4p) directly to your PC — no extra software needed. SNP Data Pass/Fail Analysis (Pro): Load a full production lot of SNP files and run automated Pass/Fail testing against spec limits (insertion loss, return loss, rejection, group delay). View Yield, Cpk, and worst-case device stats instantly. Export PDF or CSV reports in one click. Design Lot Comparison (Pro): Compare multiple design revisions or production lots side by side. Extract parameters (IL, 3 dB BW, center frequency) from hundreds of SNP files and visualize distributions via Box Plot, Overlay, and Trend views — ideal for DOE and root-cause analysis. De-embedding (Pro): Remove fixture or cable effects by loading a reference S-parameter file. See the before/after correction instantly on Smith Chart and dB plots. Plot & Simulation Config Files (Pro): Save your full plot setup (graph list, markers, scale, de-embedding) as a .pcf file. Save circuit simulation state (topology, values, sweep range) as a .pcfs file. Restore everything on any PC instantly. Built-in File Explorer: Browse, multi-select, and drag & drop SNP files into the plot area without leaving the app. [Use Cases] Field Inspection: Receive a Touchstone file via email and check S-parameter plots instantly on your phone. Production QC: Batch test a full filter lot, get Yield/Cpk, and identify failures — in under a minute. Design Verification: Compare pre/post-tuning SNP data with the Lot Comparison tool. VNA Automation: Capture S-parameters from Keysight ENA/PNA directly to your PC — free, no license required. Rapid Prototyping: Auto-match impedance and verify with real Murata component data. Intro Video: https://www.youtube.com/shorts/Ca3n9mRtBro Usage Video: https://youtube.com/shorts/h_3rNAH8O50 Download RF View — a complete RF lab in your pocket and on your desktop. Windows Desktop: https://rfview.com